CAMERA & DETECTORS
Laser Beamprofiler
Beam R // XY Scanning Slit Beam Profiler
DataRay’s Beam’R2 is well suited for many laser beam profiling applications. With both standard 2.5 µm slits and larger knife-edge slits, the Beam’R2 is capable of measuring beams with diameters as small as 2 µm. With options for both silicon and InGaAs or extended InGaAs, the Beam’R2 can profile beams from 190 nm to 2500 nm. Scanning slit instruments offer much higher resolution than camera based systems.
DataRay’s BeamMap2 represents a radically different approach to real-time beam profiling. It extends the Beam’R2’s measurement capabilities by allowing for measurements at multiple locations along the beam’s travel. This real-time slit scanning system uses XY slit pairs in multiple z planes on a rotating puck to simultaneously measure four beam profiles at four different z locations. The BeamMap2’s unique, patented design is most advantageous for real-time measurement of focus position, M2, beam divergence and pointing.
Features
- 190 to 1150 nm, Silicon detector
- 650 to 1800 nm, InGaAs detector
- 1000 to 2300 or 2500 nm, InGaAs (extended) detector
- Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
- Port-powered USB 2.0; flexible 3 m cable; no power brick
- 0.1 µm sampling and resolution
- Linear & log X-Y profiles, centroid
- Profile zoom & slit width compensation
- Economical and accurate
- M² option – beam propagation analysis, divergence, focus
Key Applications
- Laser printing & marking
- Medical lasers
- Diode laser systems
- Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging waveguides and fiber ends
- Development, production, field service
- CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]
- M² measurement with available M2DU stage
Key Specifications
