SPECTROSCOPY
Micro Raman PL Measurement
MAPLE II
- Micro Raman/RT-LT PL/PLE/EL System
- High performance monochromator (Variable detectors depend on different application)
- Scalability for variable application
- High resolved PL Mapping
- Fluorescence life time
Features
- Full automation to control the laser, filter Shutter and stage etc.
- Long travel range : up to 200 mm
- Time gated system to enhance the signal About 100 ~ 10,000 times
- Full automation : SW Controlled laser Power Wavelength, slit, beam path and Grating etc. Laser combiner ( up to 5 lasers)
- Compatible with Life time, Low temp PL( 4K ~ 77K) , PLE, Suface mapping & EL
- Large area X-Y stepper motorized stage & High spatial resolution : Up to 200 x 200 mm with 0.05um minimum Resolution
Key Applications
- Semiconductor characterization and testing (III-V materials)
- GaN/ZnO LED wafer surface characterization (Surface containment, uniformity, Reflectivity Thickness and bowing test)
- Solar cell EL measurement
- Sensor development for NIR CCD
- Gemstone PL, Diamond by HPTP
- Development of Material of LED with GaN / GaAs etc
- Diamond anvil PL
- TDIPL & IQE
Key Specifications
Excitation source | Wavelength | 325nm/532nm/632.8nm/785nm (up to 3 different laser) |
Beam quality | <1.2 M^2 |
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Output power | 20 mW (CW mode) |
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Spectrograph | Focal length | 320mm /500mm (two exit port) |
Spectral resolution | 0.09nm |
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Stray light rejection | 1.0 x 10^-5 |
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Sample chamber | Maple-II | High performance Spectroscopic Micro Sample Chamber |
PC control | Sample stage & filter wheel |
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Detector | Type | TE cooled CCD (Open electrode) |
Pixel format | 1,024 x 256 |
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Quantum efficiency | 59% @ 750 nm | |
Software | Solis & Monoworks | User-friendly interface for Simultaneous detector & Spectrograph control |