SPECTROSCOPY
Micro Raman PL Measurement
MAPLE mini
- Micro Raman/RT-LT PL/PLE/EL System
- Compact & Economical choice (Variable detectors depend on different application)
- User defined system
- Ultra low aberration
Features
- Compact Modular Design
- Free or Fiber coupled input/output
- Variable laser line combined
- Micro sample image
- High resolution objective lens available
Key Applications
- Semiconductor characterization and testing (III-V materials)
- GaN/ZnO LED wafer surface characterization (Surface containment, uniformity, Reflectivity Thickness and bowing test)
- Solar cell EL measurement
- Sensor development for NIR CCD
- Gemstone PL, Diamond by HPTP
- Development of Material of LED with GaN / GaAs etc
- Diamond anvil PL
- TDIPL & IQE
- Deep UV diode laser & PD development (III-Nitrides(AlGaN) and SiC etc.)
- Reflectance & Transmittance measurement (SiC/Si/Sapphire substrate etc.)
- Photoluminescence excitation(PLE) to measure the energy level (properties of absorption & recombination)
Key Specifications
Excitation source | Wavelength | 325nm/532nm/632.8nm/785nm (Select one laser) |
Beam quality | <1.2 M^2 |
|
Output power | 100 mW (CW mode) | |
Spectrograph | Focal length | 320mm (two exit port) |
Spectral resolution | 0.09nm |
|
Spectrometer (option) | Fiber optics spectromter | |
Sample chamber | Maple mini | Compact type Micro Sample Chamber |
PC control | Manal type stage & filter wheel | |
Detector | Type | PMT(R928) / Si / InGaAs |
Spectral range | 185 ~ 900nm / 900-1800nm | |
Type (CCD) | TE cooled CCD(Open electrode) | |
Pixel format | 1024 x 256 | |
Software | Solis & Monoworks | User-friendly interface for Simultaneous detector & Spectrograph control |