SPECTROSCOPY

Micro Raman PL Measurement

MAPLE mini
  • Micro Raman/RT-LT PL/PLE/EL System
  • Compact & Economical choice (Variable detectors depend on different application)
  • User defined system
  • Ultra low aberration
Features
  • Compact Modular Design
  • Free or Fiber coupled input/output
  • Variable laser line combined
  • Micro sample image
  • High resolution objective lens available
Key Applications
  • Semiconductor characterization and testing (III-V materials)
  • GaN/ZnO LED wafer surface characterization (Surface containment, uniformity, Reflectivity Thickness and bowing test)
  • Solar cell EL measurement
  • Sensor development for NIR CCD
  • Gemstone PL, Diamond by HPTP
  • Development of Material of LED with GaN / GaAs etc
  • Diamond anvil PL
  • TDIPL & IQE
  • Deep UV diode laser & PD development (III-Nitrides(AlGaN) and SiC etc.)
  • Reflectance & Transmittance measurement (SiC/Si/Sapphire substrate etc.)
  • Photoluminescence excitation(PLE) to measure the energy level (properties of absorption & recombination)
Key Specifications
Excitation source
Wavelength
325nm/532nm/632.8nm/785nm
(Select one laser)
Beam quality<1.2 M^2
Output power
100 mW (CW mode)
Spectrograph
Focal length
320mm (two exit port)
Spectral resolution
0.09nm
Spectrometer (option)Fiber optics spectromter
Sample chamberMaple miniCompact type Micro Sample Chamber
PC controlManal type stage & filter wheel
Detector
Type
PMT(R928) / Si / InGaAs
Spectral range185 ~ 900nm / 900-1800nm
Type (CCD)TE cooled CCD(Open electrode)
Pixel format1024 x 256
SoftwareSolis & Monoworks
User-friendly interface for Simultaneous detector & Spectrograph control