SPECTROSCOPY
Micro Raman PL Measurement
Ramboss Star
- High sensitivity & efficiency
- Fully integrated
- Multiple excitation source
- Fluorescence image system
- Single molecule detection
- Easy to combine with customer microscope (Inverted type available on request)
Features
- High sensitivity, offer ultra-low signal detection With minimum noise (Compatible with SERS, TIRF, SMD)
- Variable laser line combined for different Application up to 3 lasers
- Time gated system to enhance the signal about 100 ~ 10,000 times
- Motorized control : laser power, input Beam line, orientation of polarizer Pinhole size and grating etc.
- Sensitivity : Clearly resolved 2nd order of Si, Spectrum in 1 msec exposure time, Clearly resolved 4th order of Si, Spectrum in 60 sec exposure time
Key Applications
- Semiconductor characterization and testing (III-V materials)
- GaN/ZnO LED wafer surface characterization (Surface containment, uniformity, Reflectivity Thickness and bowing test)
- Solar cell EL measurement
- Sensor development for NIR CCD
- Gemstone PL, Diamond by HPTP
- Development of Material of LED with GaN / GaAs etc
- Diamond anvil PL
- TDIPL & IQE
- Deep UV diode laser & PD development (III-Nitrides(AlGaN) and SiC etc.)
- Reflectance & Transmittance measurement (SiC/Si/Sapphire substrate etc.)
- Photoluminescence excitation(PLE) to measure the energy levels (properties of absorption & recombination)
Key Specifications
| Excitation source | Wavelength | 532nm/632.8nm/785nm (up to 3 wavelength) |
| Polarization | >500 :1 linear | |
| Output power | 18 mW | |
| Spectrograph | Spectral range | 200 nm ~ 1,100 nm |
| Raman shift range | 32 cm-1 ~ 4,500cm-1 | |
| Spectral resolution | <2 cm-1 @633 nm | |
| Stray light rejection | 1.0 x 10^-5 | |
| Sample chamber | Microscope | Olympus , Nikon Series |
| Detector | Type | TE cooled CCD (Open electrode) |
| Pixel format | 1,024 x 256 | |
| Quantum efficiency | 59% @ 750 nm | |
| Dark current | 0.0005 e-/pixel/sec | |
| Software | Solis & Monoworks | User-friendly interface for Simultaneous detector & Spectrograph control |
